contents navi

Posco SNS

Posco Product Application Center

대메뉴

HOME

Common Test Part

  • Image Analyzer 이미지

    Image Analyzer

  • Hardness Tester (Micro & Vickers) 이미지

    Hardness Tester (Micro & Vickers)

  • OES (Optical Emission Spectrometer) 이미지

    OES (Optical Emission Spectrometer)

  • FE-SEM (Field Emission Scanning Electron Microscope) 이미지

    FE-SEM (Field Emission Scanning Electron Microscope)

  • EBSD (Electron Back Scattered Diffraction) 이미지

    EBSD (Electron Back Scattered Diffraction)

    • EPMA (Electron Probe Micro Analyzer) 이미지

      EPMA (Electron Probe Micro Analyzer)

    • FE–TEM (Field Emission Transmission Electron Microscope) 이미지

      FE–TEM (Field Emission Transmission Electron Microscope)

  • XRD (X-Ray Diffractometer) 이미지

    XRD (X-Ray Diffractometer)

  • FIB (Focus Ion Beam Microscope) 이미지

    FIB (Focus Ion Beam Microscope)